Clarification of Error Factors in Thermal Impedance Measurement Using SiC-MOSFET Body Diodes Compared to SWITCH MOS
Kato, Fumiki; Sato, Shinji; Harada, Shinsuke; Hozoji, Hiroshi; Sakai, Aki; Watanabe, Kinuyo; Yamaguchi, Hiroshi; Sato, Hiroshi
National Institute of Advanced Industrial Science and Technology, Ibaraki, Japan